Measurement of gan/ge(001) heterojunction valence band offset by x-ray photoelectron spectroscopy | |
Guo Yan; Liu Xiang-Lin; Song Hua-Ping; Yang An-Li; Zheng Gao-Lin; Wei Hong-Yuan; Yang Shao-Yan; Zhu Qin-Sheng; Wang Zhan-Guo | |
刊名 | Chinese physics letters |
2010-06-01 | |
卷号 | 27期号:6页码:4 |
ISSN号 | 0256-307X |
DOI | 10.1088/0256-307x/27/6/067302 |
通讯作者 | Guo yan(guoyan@semi.ac.cn) |
英文摘要 | X-ray photoelectron spectroscopy has been used to measure the valence band offset (vbo) at the gan/ge heterostructure interface. the vbo is directly determined to be 1.13 +/- 0.19 ev, according to the relationship between the conduction band offset delta e-c and the valence band offset delta e-v : delta e-c = e-g(gan) - e-g(ge) - delta e-v, and taking the room-temperature band-gaps as 3.4 and 0.67 ev for gan and ge, respectively. the conduction band offset is deduced to be 1.6 +/- 0.19 ev, which indicates a type-i band alignment for gan/ge. accurate determination of the valence and conduction band offsets is important for the use of gan/ge based devices. |
WOS关键词 | GE ; GAAS ; GROWTH |
WOS研究方向 | Physics |
WOS类目 | Physics, Multidisciplinary |
语种 | 英语 |
出版者 | IOP PUBLISHING LTD |
WOS记录号 | WOS:000278803400050 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2428043 |
专题 | 半导体研究所 |
通讯作者 | Guo Yan |
作者单位 | Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Guo Yan,Liu Xiang-Lin,Song Hua-Ping,et al. Measurement of gan/ge(001) heterojunction valence band offset by x-ray photoelectron spectroscopy[J]. Chinese physics letters,2010,27(6):4. |
APA | Guo Yan.,Liu Xiang-Lin.,Song Hua-Ping.,Yang An-Li.,Zheng Gao-Lin.,...&Wang Zhan-Guo.(2010).Measurement of gan/ge(001) heterojunction valence band offset by x-ray photoelectron spectroscopy.Chinese physics letters,27(6),4. |
MLA | Guo Yan,et al."Measurement of gan/ge(001) heterojunction valence band offset by x-ray photoelectron spectroscopy".Chinese physics letters 27.6(2010):4. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论