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Numerical and theoretical analysis of the crosstalk in linear optical amplifiers
Jin, CY; Huang, YZ; Yu, LJ; Deng, SL
刊名Ieee journal of quantum electronics
2005-05-01
卷号41期号:5页码:636-641
关键词Crosstalk Linear optical amplifier (loa) Relaxation oscillation Semiconductor optical amplifier (soa) Small-signal analysis
ISSN号0018-9197
DOI10.1109/jqe.2005.845354
通讯作者Jin, cy(yzhuang@red.semi.ac.cn)
英文摘要The dynamic characteristics, including the crosstalk and relaxation oscillation, of linear optical amplifiers (loas) are investigated by small-signal analysis under an averaging carrier density approximation and compared with the results of numerical simulation. the good agreement between the numerical simulation and the small-signal analysis indicated the averaging carrier density is an appropriate approximation for analyzing loas. theoretical analyzes also show that the dynamic properties of the vertical laser fields dominate the dynamic performance of loas. based on the small-signal analysis, a concise equation for the crosstalk under high bit rate was derived, which can be applied to measure the differential gain of loas.
WOS关键词VERTICAL LASER FIELD ; MODEL ; PERFORMANCE
WOS研究方向Engineering ; Optics ; Physics
WOS类目Engineering, Electrical & Electronic ; Optics ; Physics, Applied
语种英语
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号WOS:000228567000005
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2426283
专题半导体研究所
通讯作者Jin, CY
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Jin, CY,Huang, YZ,Yu, LJ,et al. Numerical and theoretical analysis of the crosstalk in linear optical amplifiers[J]. Ieee journal of quantum electronics,2005,41(5):636-641.
APA Jin, CY,Huang, YZ,Yu, LJ,&Deng, SL.(2005).Numerical and theoretical analysis of the crosstalk in linear optical amplifiers.Ieee journal of quantum electronics,41(5),636-641.
MLA Jin, CY,et al."Numerical and theoretical analysis of the crosstalk in linear optical amplifiers".Ieee journal of quantum electronics 41.5(2005):636-641.
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