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	Measurement of surface form deviation of the plane optical element using grid line method
	Jiang, Xiaojun1,3; Huang, Huijie2; Wang, Xiangzhao2; Zeng, Aijun2
刊名	Optik
	2010
卷号	121期号:12页码:1133-1137
关键词	Optical test Surface form deviation Digital image processing Fringe analysis
ISSN号	0030-4026
DOI	10.1016/j.ijleo.2008.12.024
通讯作者	Jiang, xiaojun(xiaojunj@siom.ac.cn)
英文摘要	A method for automatically measuring the surface form deviation of the plane optical element is presented. it uses the image pre-processing technique to obtain the centerlines of the interference fringes, the grid line technique to search the average fringe spacing and the maximum curvature of the interference fringes, and the normalization to obtain the value of surface form deviation of the optical element. the experimental results show that the measuring precision of the surface form deviation of the plane optical element reaches the value of 0.1 and the method improves the adaptation capability of processing the interference fringes, which indicates that the method can substitute the visual interpretation of interference fringes in high-noise workshop environment. (c) 2009 elsevier gmbh. all rights reserved.
WOS研究方向	Optics
WOS类目	Optics
语种	英语
出版者	ELSEVIER GMBH, URBAN & FISCHER VERLAG
WOS记录号	WOS:000280042600012
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2413088
专题	中国科学院大学
通讯作者	Jiang, Xiaojun
作者单位	1.Shanghai Second Polytech Univ, Shanghai 201209, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 3.Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Jiang, Xiaojun,Huang, Huijie,Wang, Xiangzhao,et al. Measurement of surface form deviation of the plane optical element using grid line method[J]. Optik,2010,121(12):1133-1137.
APA	Jiang, Xiaojun,Huang, Huijie,Wang, Xiangzhao,&Zeng, Aijun.(2010).Measurement of surface form deviation of the plane optical element using grid line method.Optik,121(12),1133-1137.
MLA	Jiang, Xiaojun,et al."Measurement of surface form deviation of the plane optical element using grid line method".Optik 121.12(2010):1133-1137.

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