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	Optimization of hierarchical SOC test time based on genetic algorithm
	Li Jiao[1]; Zhang Jinyi[2]; Shi Hui[3]; Luo xiao wei[4]
	2008
会议名称	2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2
会议日期	2008-07-28
页码	424-427
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2346249
专题	上海大学
作者单位	1.College of Sciences, Shanghai University, Box 221, No. 149 Yanchang Road, Shanghai 200072, China 2.Key Laboratory Advanced Display and System Applications , Ministry of Education, Box 221, No. 149 Yanchang Road, Shanghai 200072, China 3.Microelectronic Research and Development Center, Shanghai University, Box 221, No. 149 Yanchang Road, Shanghai 200072, China 4.Key Laboratory of Special Fiber Optics and Optical Access Networks , Ministry of Education, Box 221, No. 149 Yanchang Road, Shanghai 200072, China
推荐引用方式 GB/T 7714	Li Jiao[1],Zhang Jinyi[2],Shi Hui[3],et al. Optimization of hierarchical SOC test time based on genetic algorithm[C]. 见:2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2. 2008-07-28.

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