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	薄膜取向性对金刚石紫外光探测器性能的影响
	Lai, Jian-Ming[1]; Wang, Lin-Jun[2]; Liu, Jian-Min[3]; Ma, Ying[4]; Hu, Guang[5]; Zhu, Xue-Feng[6]; Huang, Jian[7]; Xia, Yi-Ben[8]
刊名	光电子&#183 ; 激光
	2008
卷号	19页码:1636-1639
关键词	金刚石膜 紫外光探测器 取向性
ISSN号	1005-0086
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2343926
专题	上海大学
作者单位	[1]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[2]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[3]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[4]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[5]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[6]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[7]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[8]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China
推荐引用方式 GB/T 7714	Lai, Jian-Ming[1],Wang, Lin-Jun[2],Liu, Jian-Min[3],等. 薄膜取向性对金刚石紫外光探测器性能的影响[J]. 光电子&#183, 激光,2008,19:1636-1639.
APA	Lai, Jian-Ming[1].,Wang, Lin-Jun[2].,Liu, Jian-Min[3].,Ma, Ying[4].,Hu, Guang[5].,...&Xia, Yi-Ben[8].(2008).薄膜取向性对金刚石紫外光探测器性能的影响.光电子·,19,1636-1639.
MLA	Lai, Jian-Ming[1],et al."薄膜取向性对金刚石紫外光探测器性能的影响".光电子· 19(2008):1636-1639.

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