Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors

CORC > 苏州纳米技术与纳米仿生研究所 > 中国科学院苏州纳米技术与纳米仿生研究所 > 大科学装置

	Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors
	Zhang, Liqun(张立群); An Dingsun(丁孙安); Yang, Hui(杨辉); Liu, Tong(刘通); Huang, Rong(黄荣); Li, Fangsen(李坊森); Huang, Zengli(黄增立); Zhang, Jian(张鉴); Liu, Jianping(刘建平); Zhang, Shuming(张书明)
刊名	CURRENT APPLIED PHYSICS
	2018
其他题名	Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors
语种	英语
内容类型	期刊论文
源URL	[http://ir.sinano.ac.cn/handle/332007/6303]
专题	苏州纳米技术与纳米仿生研究所_大科学装置
作者单位	中国科学院苏州纳米技术与纳米仿生研究所
推荐引用方式 GB/T 7714	Zhang, Liqun,An Dingsun,Yang, Hui,et al. Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors[J]. CURRENT APPLIED PHYSICS,2018.
APA	Zhang, Liqun.,An Dingsun.,Yang, Hui.,Liu, Tong.,Huang, Rong.,...&Zhang, Shuming.(2018).Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors.CURRENT APPLIED PHYSICS.
MLA	Zhang, Liqun,et al."Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors".CURRENT APPLIED PHYSICS (2018).