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Stress evolution and lattice distortion induced by thickness variation and lattice misfit in La0.67Sr0.33MnO3-delta films
Chen, C. Z.[1]; Cai, C. B.[2]; Liu, Z. Y.[3]; Peng, L.[4]; Gao, B.[5]; Fan, F.[6]; Lu, Y. M.[7]; Zeng, R.[8]; Guo, Z. P.[9]; Li, W. X.[10]
刊名SOLID STATE COMMUNICATIONS
2010
卷号150页码:66-69
关键词LSMO Stress effect Raman spectrum
ISSN号0038-1098
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2318051
专题上海大学
作者单位1.[1]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
2.[2]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
3.[3]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
4.[4]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
5.[5]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
6.[6]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
7.[7]Shanghai Univ, Dept Phys, Res Ctr Superconductors & Appl Technol, Shanghai 200444, Peoples R China.
8.[8]Univ Wollongong, Inst Superconduct & Elect Mat, Wollongong, NSW 2522, Australia.
9.[9]Univ Wollongong, Inst Superconduct & Elect Mat, Wollongong, NSW 2522, Australia.
10.[10]Univ Wollongong, Inst Superconduct & Elect Mat, Wollongong, NSW 2522, Australia.
推荐引用方式
GB/T 7714
Chen, C. Z.[1],Cai, C. B.[2],Liu, Z. Y.[3],et al. Stress evolution and lattice distortion induced by thickness variation and lattice misfit in La0.67Sr0.33MnO3-delta films[J]. SOLID STATE COMMUNICATIONS,2010,150:66-69.
APA Chen, C. Z.[1].,Cai, C. B.[2].,Liu, Z. Y.[3].,Peng, L.[4].,Gao, B.[5].,...&Dou, S. X.[11].(2010).Stress evolution and lattice distortion induced by thickness variation and lattice misfit in La0.67Sr0.33MnO3-delta films.SOLID STATE COMMUNICATIONS,150,66-69.
MLA Chen, C. Z.[1],et al."Stress evolution and lattice distortion induced by thickness variation and lattice misfit in La0.67Sr0.33MnO3-delta films".SOLID STATE COMMUNICATIONS 150(2010):66-69.
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