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	Distinguishment of the different parts of objects by terahertz imaging
	Ge, Jin[1]; Wang, Reng[2]; Hu, Shuhong[3]; Dai, Ning[4]; Li, Dong[5]; Ma, Hong[6]; Ma, Guohong[7]
	2010
会议名称	5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
会议日期	2010-04-26
关键词	Terahertz image transmittance phase optical thickness
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2313990
专题	上海大学
作者单位	[1]National Laboratory for Infrared, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China [2]National Laboratory for Infrared, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China [3]National Laboratory for Infrared, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China [4]National Laboratory for Infrared, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China [5]Department of Physics, Shanghai University, Shanghai 200444, China[6]Department of Physics, Shanghai University, Shanghai 200444, China[7]Department of Physics, Shanghai University, Shanghai 200444, China
推荐引用方式 GB/T 7714	Ge, Jin[1],Wang, Reng[2],Hu, Shuhong[3],et al. Distinguishment of the different parts of objects by terahertz imaging[C]. 见:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology. 2010-04-26.

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