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	Improved delay fault coverage in soc using controllable multi-scan-enable
	Zhang, Jin-Yi[1]; Huang, Xu-Hui[2]; Cai, Wan-Lin[3]; Weng, Han-Yi[4]
	2010
会议名称	2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
会议日期	2010-11-01
页码	1973-1975
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2313718
专题	上海大学
作者单位	[1]Key Laboratory of Advanced Displays and System Application, Ministry of Education, Shanghai University, No.149 Yanchang Road, Shanghai 200072, China |Key Laboratory of Special Fiber Optics and Optical Access Networks , Ministry of Education, No.149 Yanchang Road, Shanghai 200072, China[2]Microelectronic Research and Development Center, Shanghai University, No.149 Yanchang Road, Shanghai 200072, China [3]Microelectronic Research and Development Center, Shanghai University, No.149 Yanchang Road, Shanghai 200072, China [4]Key Laboratory of Advanced Displays and System Application, Ministry of Education, Shanghai University, No.149 Yanchang Road, Shanghai 200072, China |Key Laboratory of Special Fiber Optics and Optical Access Networks , Ministry of Education, No.149 Yanchang Road, Shanghai 200072, China
推荐引用方式 GB/T 7714	Zhang, Jin-Yi[1],Huang, Xu-Hui[2],Cai, Wan-Lin[3],et al. Improved delay fault coverage in soc using controllable multi-scan-enable[C]. 见:2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology. 2010-11-01.

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