| Spectroscopic Ellipsometry Characterization of Optical Properties for Ti-Doped SiO2 Mesoporous Films | |
| Yue, Chunxiao[1]; Sun, Zuyao[2]; Yao, Lanfang[3]; Jiang, Kaiming[4] | |
| 2011 | |
| 会议名称 | 9th Chinese International Nanoscience and Technology Symposium |
| 页码 | 15-20 |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2306090 |
| 专题 | 上海大学 |
| 作者单位 | 1.Shanghai Jianqiao Coll, Shanghai 201319, Peoples R China. 2.Shanghai Maritime Univ, Coll Arts & Sci, Shanghai 200135, Peoples R China. 3.Shanghai Univ Sci & Technol, Shanghai 200090, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Yue, Chunxiao[1],Sun, Zuyao[2],Yao, Lanfang[3],et al. Spectroscopic Ellipsometry Characterization of Optical Properties for Ti-Doped SiO2 Mesoporous Films[C]. 见:9th Chinese International Nanoscience and Technology Symposium. |
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