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	Preparation of TEM specimens from gas-atomized Fe-6.5wt.%Si powders with several micrometers using focused ion beam
	Zhao, Shichao[1]; Xie, Ke[2]; Song, Changjiang[3]; Zhai, Qijie[4]
	2013
会议名称	MECHATRONICS AND INTELLIGENT MATERIALS III, PTS 1-3
会议日期	2013-05-18
关键词	TEM specimen preparation Gas-atomized powder Microstructure
页码	224-229
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2290095
专题	上海大学
作者单位	1.[1]Shanghai Univ, Sch Mat Sci & Engn, Shanghai Key Lab Modern Met & Mat Proc, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Mat Sci & Engn, Shanghai Key Lab Modern Met & Mat Proc, Shanghai 200072, Peoples R China. 3.[3]Shanghai Univ, Sch Mat Sci & Engn, Shanghai Key Lab Modern Met & Mat Proc, Shanghai 200072, Peoples R China. 4.[4]Shanghai Univ, Sch Mat Sci & Engn, Shanghai Key Lab Modern Met & Mat Proc, Shanghai 200072, Peoples R China.
推荐引用方式 GB/T 7714	Zhao, Shichao[1],Xie, Ke[2],Song, Changjiang[3],et al. Preparation of TEM specimens from gas-atomized Fe-6.5wt.%Si powders with several micrometers using focused ion beam[C]. 见:MECHATRONICS AND INTELLIGENT MATERIALS III, PTS 1-3. 2013-05-18.

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