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	Full field electron spectromicroscopy applied to ferroelectric materials
	Barrett, N.[1]; Rault, J. E.[2]; Wang, J. L.[3]; Mathieu, C.[4]; Locatelli, A.[5]; Mentes, T. O.[6]; Nino, M. A.[7]; Fusil, S.[8]; Bibes, M.[9]; Barthelemy, A.[10]
刊名	Journal of Applied Physics
	2013
卷号	113
ISSN号	00218979
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2289596
专题	上海大学
作者单位	1.[1]IRAMIS SPCSI LENSIS, F-91191 Gif Sur Yvette, France. 2.[2]IRAMIS SPCSI LENSIS, F-91191 Gif Sur Yvette, France. 3.[3]IRAMIS SPCSI LENSIS, F-91191 Gif Sur Yvette, France. 4.[4]IRAMIS SPCSI LENSIS, F-91191 Gif Sur Yvette, France. 5.[5]Sincrotrone Trieste SCpA, I-34149 Trieste, Italy. 6.[6]Sincrotrone Trieste SCpA, I-34149 Trieste, Italy. 7.[7]Inst Madrileno Estudios Avanzados Nanociencia IMD, Madrid 28049, Spain. 8.[8]Univ Evry Val dEssonne, F-91025 Evry, France. 9.[9]Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France. 10.[10]Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France.
推荐引用方式 GB/T 7714	Barrett, N.[1],Rault, J. E.[2],Wang, J. L.[3],et al. Full field electron spectromicroscopy applied to ferroelectric materials[J]. Journal of Applied Physics,2013,113.
APA	Barrett, N.[1].,Rault, J. E.[2].,Wang, J. L.[3].,Mathieu, C.[4].,Locatelli, A.[5].,...&Schneider, C. M.[18].(2013).Full field electron spectromicroscopy applied to ferroelectric materials.Journal of Applied Physics,113.
MLA	Barrett, N.[1],et al."Full field electron spectromicroscopy applied to ferroelectric materials".Journal of Applied Physics 113(2013).

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