CORC  > 上海大学
AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf
Cui, Xiaopeng[1]; Feng, Zhenjie[2]; Jin, Yuan[3]; Cao, Yiming[4]; Deng, Dongmei[5]; Chu, Hao[6]; Cao, Shixun[7]; Dong, Cheng[8]; Zhang, Jincang[9]
刊名JOURNAL OF APPLIED CRYSTALLOGRAPHY
2015
卷号48页码:1581-1586
关键词AutoFP Rietveld refinement FullProf computer programs
ISSN号1600-5767
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2266906
专题上海大学
作者单位1.[1]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
2.[2]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
3.Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China.
4.[3]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
5.[4]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
6.[5]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
7.[6]CALTECH, Dept Phys, Pasadena, CA 91125 USA.
8.[7]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
9.Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China.
10.[8]Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China.
推荐引用方式
GB/T 7714
Cui, Xiaopeng[1],Feng, Zhenjie[2],Jin, Yuan[3],et al. AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2015,48:1581-1586.
APA Cui, Xiaopeng[1].,Feng, Zhenjie[2].,Jin, Yuan[3].,Cao, Yiming[4].,Deng, Dongmei[5].,...&Zhang, Jincang[9].(2015).AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf.JOURNAL OF APPLIED CRYSTALLOGRAPHY,48,1581-1586.
MLA Cui, Xiaopeng[1],et al."AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf".JOURNAL OF APPLIED CRYSTALLOGRAPHY 48(2015):1581-1586.
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