AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf | |
Cui, Xiaopeng[1]; Feng, Zhenjie[2]; Jin, Yuan[3]; Cao, Yiming[4]; Deng, Dongmei[5]; Chu, Hao[6]; Cao, Shixun[7]; Dong, Cheng[8]; Zhang, Jincang[9] | |
刊名 | JOURNAL OF APPLIED CRYSTALLOGRAPHY
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2015 | |
卷号 | 48页码:1581-1586 |
关键词 | AutoFP Rietveld refinement FullProf computer programs |
ISSN号 | 1600-5767 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2266906 |
专题 | 上海大学 |
作者单位 | 1.[1]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 2.[2]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 3.Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 4.[3]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 5.[4]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 6.[5]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 7.[6]CALTECH, Dept Phys, Pasadena, CA 91125 USA. 8.[7]Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 9.Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 10.[8]Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China. |
推荐引用方式 GB/T 7714 | Cui, Xiaopeng[1],Feng, Zhenjie[2],Jin, Yuan[3],et al. AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2015,48:1581-1586. |
APA | Cui, Xiaopeng[1].,Feng, Zhenjie[2].,Jin, Yuan[3].,Cao, Yiming[4].,Deng, Dongmei[5].,...&Zhang, Jincang[9].(2015).AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf.JOURNAL OF APPLIED CRYSTALLOGRAPHY,48,1581-1586. |
MLA | Cui, Xiaopeng[1],et al."AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf".JOURNAL OF APPLIED CRYSTALLOGRAPHY 48(2015):1581-1586. |
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