Reliability of Graphene-based Films Used for High Power Electronics Packaging | |
Huang, Shirong[1]; Zhang, Yong[2]; Wang, Nan[3]; Wang, Ning[4]; Fu, Yifeng[5]; Ye, Lilei[6]; Liu, Johan[7] | |
2015 | |
会议名称 | 16 int conf elect packaging technology |
会议日期 | 2015-01-01 |
关键词 | graphene-based film reliability test electronic packaging |
页码 | 852-855 |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2240347 |
专题 | 上海大学 |
作者单位 | 1.[1]Shanghai Univ, Sch Automat & Mech Engn, SMIT Ctr, Box 282,Yanchang Rd 149, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Automat & Mech Engn, SMIT Ctr, Box 282,Yanchang Rd 149, Shanghai 200072, Peoples R China. 3.Chalmers, SMIT Ctr, SE-41296 Gothenburg, Sweden.,Chalmers, Dept Microtechnol & Nanosci MC2, BioNano Syst Lab, SE-41296 Gothenburg, Sweden. 4.[3]Chalmers, SMIT Ctr, SE-41296 Gothenburg, Sweden.,Chalmers, Dept Microtechnol & Nanosci MC2, BioNano Syst Lab, SE-41296 Gothenburg, Sweden. 5.[4]Shanghai Univ, Sch Automat & Mech Engn, SMIT Ctr, Box 282,Yanchang Rd 149, Shanghai 200072, Peoples R China. 6.[5]Chalmers, SMIT Ctr, SE-41296 Gothenburg, Sweden.,Chalmers, Dept Microtechnol & Nanosci MC2, BioNano Syst Lab, SE-41296 Gothenburg, Sweden. 7.SHT Smart High Tech AB, SE-41133 Gothenburg, Sweden. 8.[6]SHT Smart High Tech AB, SE-41133 Gothenburg, Sweden. 9.[7]Shanghai Univ, Sch Automat & Mech Engn, SMIT Ctr, Box 282,Yanchang Rd 149, Shanghai 200072, Peoples R China. 10.Chalmers, SMIT Ctr, SE-41296 Gothenburg, Sweden.,Chalmers, Dept Microtechnol & Nanosci MC2, BioNano Syst Lab, SE-41296 Gothenburg, Sweden. |
推荐引用方式 GB/T 7714 | Huang, Shirong[1],Zhang, Yong[2],Wang, Nan[3],et al. Reliability of Graphene-based Films Used for High Power Electronics Packaging[C]. 见:16 int conf elect packaging technology. 2015-01-01. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论