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Effect of P and Ge doping on microstructure of Sn-0.3Ag-0.7Cu/Ni-P solder joints
Yan, Xingchen[1]; Xu, Kexin[2]; Wang, Junjie[3]; Wei, Xicheng[4]; Wang, Wurong[5]
刊名SOLDERING & SURFACE MOUNT TECHNOLOGY
2016
卷号28页码:215-221
关键词Microstructure IMC Ni-P plating SAC0307 Thermal aging Doping
ISSN号0954-0911
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2229687
专题上海大学
作者单位1.[1]Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China.
2.[2]China Leihua Elect Technol Res Inst, Wuxi, Peoples R China.
3.[3]Shanghai Automobile Gear Works, Shanghai, Peoples R China.
4.[4]Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China.
5.[5]Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China.
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GB/T 7714
Yan, Xingchen[1],Xu, Kexin[2],Wang, Junjie[3],et al. Effect of P and Ge doping on microstructure of Sn-0.3Ag-0.7Cu/Ni-P solder joints[J]. SOLDERING & SURFACE MOUNT TECHNOLOGY,2016,28:215-221.
APA Yan, Xingchen[1],Xu, Kexin[2],Wang, Junjie[3],Wei, Xicheng[4],&Wang, Wurong[5].(2016).Effect of P and Ge doping on microstructure of Sn-0.3Ag-0.7Cu/Ni-P solder joints.SOLDERING & SURFACE MOUNT TECHNOLOGY,28,215-221.
MLA Yan, Xingchen[1],et al."Effect of P and Ge doping on microstructure of Sn-0.3Ag-0.7Cu/Ni-P solder joints".SOLDERING & SURFACE MOUNT TECHNOLOGY 28(2016):215-221.
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