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	Electrical Transport Properties of Au Nanoparticles and Thin Films on Ge Probed Using a Conducting Atomic Force Microscope
	Guo, Erjuan[1]; Zeng, Zhigang[2]; Shi, Xiaobo[3]; Long, Xiao[4]; Wang, Xiaohong[5]
刊名	LANGMUIR
	2016
卷号	32页码:10589-10596
ISSN号	0743-7463
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2229274
专题	上海大学
作者单位	1.[1]Shanghai Univ, Coll Sci, Dept Phys, Shanghai 200444, Peoples R China. 2.Shanghai Univ, Coll Sci, Inst NanoMicroEnergy, Shanghai 200444, Peoples R China. 3.[2]Shanghai Univ, Coll Sci, Dept Phys, Shanghai 200444, Peoples R China. 4.Shanghai Univ, Coll Sci, Inst NanoMicroEnergy, Shanghai 200444, Peoples R China. 5.Shanghai Univ, Shanghai Key Lab High Temp Superconductor, Shanghai 200444, Peoples R China. 6.[3]Shanghai Univ, Coll Sci, Dept Phys, Shanghai 200444, Peoples R China. 7.Shanghai Univ, Coll Sci, Inst NanoMicroEnergy, Shanghai 200444, Peoples R China. 8.[4]Shanghai Univ, Coll Sci, Dept Phys, Shanghai 200444, Peoples R China. 9.Shanghai Univ, Coll Sci, Inst NanoMicroEnergy, Shanghai 200444, Peoples R China. 10.[5]Shanghai Univ, Coll Sci, Inst NanoMicroEnergy, Shanghai 200444, Peoples R China.
推荐引用方式 GB/T 7714	Guo, Erjuan[1],Zeng, Zhigang[2],Shi, Xiaobo[3],et al. Electrical Transport Properties of Au Nanoparticles and Thin Films on Ge Probed Using a Conducting Atomic Force Microscope[J]. LANGMUIR,2016,32:10589-10596.
APA	Guo, Erjuan[1],Zeng, Zhigang[2],Shi, Xiaobo[3],Long, Xiao[4],&Wang, Xiaohong[5].(2016).Electrical Transport Properties of Au Nanoparticles and Thin Films on Ge Probed Using a Conducting Atomic Force Microscope.LANGMUIR,32,10589-10596.
MLA	Guo, Erjuan[1],et al."Electrical Transport Properties of Au Nanoparticles and Thin Films on Ge Probed Using a Conducting Atomic Force Microscope".LANGMUIR 32(2016):10589-10596.

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