CORC  > 安徽大学
A quasi-two-dimensional threshold voltage model for fully depleted SOI LDMOS
Chen, JN [ 1 ]; By:Wu, XL [ 1 ]; Ke, DM [ 1 ] Book Group Author:IEEE
刊名2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008
2008
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2205477
专题安徽大学
作者单位Anhui Univ, Inst Elect Sci & Technol, Hefei 230039, Anhui, Peoples R China Organization-Enhanced Name Anhui University
推荐引用方式
GB/T 7714
Chen, JN [ 1 ],By:Wu, XL [ 1 ],Ke, DM [ 1 ] Book Group Author:IEEE. A quasi-two-dimensional threshold voltage model for fully depleted SOI LDMOS[J]. 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008,2008.
APA Chen, JN [ 1 ],By:Wu, XL [ 1 ],&Ke, DM [ 1 ] Book Group Author:IEEE.(2008).A quasi-two-dimensional threshold voltage model for fully depleted SOI LDMOS.2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008.
MLA Chen, JN [ 1 ],et al."A quasi-two-dimensional threshold voltage model for fully depleted SOI LDMOS".2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008 (2008).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace