QQ客服 官方微博 反馈留言

	Segmenting overlapping nano-objects in atomic force microscopy image
	Wang, Qian[1]; Han, Yuexing[2]; Li, Qing[3]; Wang, Bing[4]; Konagaya, Akihiko[5]
刊名	JOURNAL OF NANOPHOTONICS
	2018
卷号	12
关键词	overlapping micro/nano-objects segmentation noises removing overlapping nanoparticles overlapping nano-objects AFM images processing automatically analyze nanoparticles
ISSN号	1934-2608
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2179673
专题	上海大学
作者单位	1.[1]Shanghai Univ, Sch Comp Engn & Sci, Shanghai, Peoples R China. 2.[2]Shanghai Univ, Sch Comp Engn & Sci, Shanghai, Peoples R China. 3.Shanghai Univ, Shanghai Inst Adv Commun & Data Sci, Key Lab Shanghai, Shanghai, Peoples R China. 4.Tokyo Inst Technol, Tokyo, Japan. 5.[3]Shanghai Univ, Sch Comp Engn & Sci, Shanghai, Peoples R China. 6.[4]Shanghai Univ, Sch Comp Engn & Sci, Shanghai, Peoples R China. 7.[5]Tokyo Inst Technol, Tokyo, Japan. 8.Natl Inst Informat, Tokyo, Japan.
推荐引用方式 GB/T 7714	Wang, Qian[1],Han, Yuexing[2],Li, Qing[3],et al. Segmenting overlapping nano-objects in atomic force microscopy image[J]. JOURNAL OF NANOPHOTONICS,2018,12.
APA	Wang, Qian[1],Han, Yuexing[2],Li, Qing[3],Wang, Bing[4],&Konagaya, Akihiko[5].(2018).Segmenting overlapping nano-objects in atomic force microscopy image.JOURNAL OF NANOPHOTONICS,12.
MLA	Wang, Qian[1],et al."Segmenting overlapping nano-objects in atomic force microscopy image".JOURNAL OF NANOPHOTONICS 12(2018).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。