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First-principles study on the minimization of over-erase phenomenon in Si3N4 trapping layer
Wang Jia-Yu; Jiang Xian-Wei; Lu Wen-Juan; Dai Yue-Hua; Chen Zhen; Li Ning; Li Xiao-Feng; Jin Bo
刊名ACTA PHYSICA SINICA
2015
卷号Vol.64 No.13
关键词FLASH MEMORY NITRIDE
ISSN号1000-3290
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2157552
专题安徽大学
作者单位1.Chinese Acad Sci, Hefei Inst Phys Sci, Internet Network Informat Ctr, Hefei 230031, Peoples R China
2.Anhui Univ, Inst Elect & Informat Engn, Hefei 230601, Peoples R China
推荐引用方式
GB/T 7714
Wang Jia-Yu,Jiang Xian-Wei,Lu Wen-Juan,et al. First-principles study on the minimization of over-erase phenomenon in Si3N4 trapping layer[J]. ACTA PHYSICA SINICA,2015,Vol.64 No.13.
APA Wang Jia-Yu.,Jiang Xian-Wei.,Lu Wen-Juan.,Dai Yue-Hua.,Chen Zhen.,...&Jin Bo.(2015).First-principles study on the minimization of over-erase phenomenon in Si3N4 trapping layer.ACTA PHYSICA SINICA,Vol.64 No.13.
MLA Wang Jia-Yu,et al."First-principles study on the minimization of over-erase phenomenon in Si3N4 trapping layer".ACTA PHYSICA SINICA Vol.64 No.13(2015).
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