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Flexible printed circuit defective detection based on image registration (EI收录)
Huang, Jie-Xian[1]; Li, Di[1]; Ye, Feng[1]; Dong, Zhi-Jie[1]
会议名称Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010
会议日期October 16, 2010 - October 18, 2010
会议地点Yantai, China
关键词Computer applications Defects Electronic equipment manufacture Entropy Genetic algorithms Image registration Inspection Optimization Signal detection Signal processing
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内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/2064852
专题华南理工大学
作者单位[1] School of Mechanical Automotive Engineering, South China University of Technology, Wushan RD., Tianhe District, Guanghou, 510641, China
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GB/T 7714
Huang, Jie-Xian[1],Li, Di[1],Ye, Feng[1],等. Flexible printed circuit defective detection based on image registration (EI收录)[C]. 见:Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010. Yantai, China. October 16, 2010 - October 18, 2010.
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