Unsupervised defect detection of flexible printed circuit board gold surfaces based on wavelet packet frame (EI收录) | |
Wang, Qingxiang[1,2]; Li, Di[1]; Zhang, Wujie[1]; Cao, Dong[2]; Chen, Hao[2] | |
会议名称 | 2010 2nd International Conference on Industrial and Information Systems, IIS 2010 |
会议日期 | July 10, 2010 - July 11, 2010 |
会议地点 | Dalian, China |
关键词 | Feature extraction Gold Gold metallurgy Image segmentation Industry Information systems Inspection Principal component analysis Printed circuit manufacture Surface defects |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2063550 |
专题 | 华南理工大学 |
作者单位 | 1.[1] School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou 510641, Guangdong, China 2.[2] School of Information Technology, Guangzhou University of Chinese Medicine, Guangzhou, 510006, Guangdong, China |
推荐引用方式 GB/T 7714 | Wang, Qingxiang[1,2],Li, Di[1],Zhang, Wujie[1],等. Unsupervised defect detection of flexible printed circuit board gold surfaces based on wavelet packet frame (EI收录)[C]. 见:2010 2nd International Conference on Industrial and Information Systems, IIS 2010. Dalian, China. July 10, 2010 - July 11, 2010. |
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