QQ客服 官方微博 反馈留言

	Unsupervised defect detection of flexible printed circuit board gold surfaces based on wavelet packet frame (EI收录)
	Wang, Qingxiang[1,2]; Li, Di[1]; Zhang, Wujie[1]; Cao, Dong[2]; Chen, Hao[2]
会议名称	2010 2nd International Conference on Industrial and Information Systems, IIS 2010
会议日期	July 10, 2010 - July 11, 2010
会议地点	Dalian, China
关键词	Feature extraction Gold Gold metallurgy Image segmentation Industry Information systems Inspection Principal component analysis Printed circuit manufacture Surface defects
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2063550
专题	华南理工大学
作者单位	1.[1] School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou 510641, Guangdong, China 2.[2] School of Information Technology, Guangzhou University of Chinese Medicine, Guangzhou, 510006, Guangdong, China
推荐引用方式 GB/T 7714	Wang, Qingxiang[1,2],Li, Di[1],Zhang, Wujie[1],等. Unsupervised defect detection of flexible printed circuit board gold surfaces based on wavelet packet frame (EI收录)[C]. 见:2010 2nd International Conference on Industrial and Information Systems, IIS 2010. Dalian, China. July 10, 2010 - July 11, 2010.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。