| Mandrel and Spacer Engineering Based Self-aligned Triple Patterning (CPCI-S收录) | |
| Chen, Yijian[1]; Cheng, Qi[1]; Kang, Weiling[1] | |
| 会议名称 | ADVANCED ETCH TECHNOLOGY FOR NANOPATTERNING |
| 关键词 | Self-aligned double (SADP) triple (SATP) quadruple (SAQP) patterning mandrel spacer self-aligned mandrel recession (SMR) |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2055568 |
| 专题 | 华南理工大学 |
| 作者单位 | Peking Univ, Shenzhen Grad Sch, Sch Comp & Informat Engn, Shenzhen 518055, Peoples R China |
| 推荐引用方式 GB/T 7714 | Chen, Yijian[1],Cheng, Qi[1],Kang, Weiling[1]. Mandrel and Spacer Engineering Based Self-aligned Triple Patterning (CPCI-S收录)[C]. 见:ADVANCED ETCH TECHNOLOGY FOR NANOPATTERNING. |
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