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Dissolution Behavior of Cu UBM in BGA Structure Sn-3.0Ag-0.5Cu/Cu Joints during Liquid Isothermal Aging at and above the Solder's Melting Tem (CPCI-S收录)
Zhou, Min-Bo[1]; Zeng, Jing-Bo[1]; Ma, Xiao[1]; Zhang, Xin-Ping[1]
会议名称2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012)
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内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/2055330
专题华南理工大学
作者单位S China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
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GB/T 7714
Zhou, Min-Bo[1],Zeng, Jing-Bo[1],Ma, Xiao[1],等. Dissolution Behavior of Cu UBM in BGA Structure Sn-3.0Ag-0.5Cu/Cu Joints during Liquid Isothermal Aging at and above the Solder's Melting Tem (CPCI-S收录)[C]. 见:2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012).
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