| The Effect of Applied-voltage on Photon-Number of Corona Discharge on Transmission Lines Defect (CPCI-S收录) | |
| Wan Shuwei[1]; Zhao Xuesong[3]; Guo Xinyang[3]; Chen Lan[2]; Bian Xingming[2]; Yao Wenjun[4]; MacAlpine, Mark[2]; Wang Liming[2]; Guan Zhicheng[2] | |
| 会议名称 | 2013 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP) |
| 关键词 | UV characteristics photon-number transmission line defect corona discharge |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2049938 |
| 专题 | 华南理工大学 |
| 作者单位 | 1.[1]State Grid Chongqing Nanan Power Supply Co, Chongqing 401336, Peoples R China 2.[2]Tsinghua Univ, Grad Sch Shenzhen, Shenzhen 518055, Peoples R China 3.[3]Jibei Elect Power Co Ltd, Power Apparat Maintenance Co, Beijing 102488, Peoples R China 4.[4]Jibei Elect Power Co Ltd, Power Apparat Maintenance Co, Datong 037006, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wan Shuwei[1],Zhao Xuesong[3],Guo Xinyang[3],等. The Effect of Applied-voltage on Photon-Number of Corona Discharge on Transmission Lines Defect (CPCI-S收录)[C]. 见:2013 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP). |
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