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	Structural and optical properties of Cd0.8Zn0.2S thin films
	Di Xia; Tian Caijuan; Tang Rongzhe; Li Wei; Feng Lianghuan; Zhang Jingquan; Wu Lili; Lei Zhi
刊名	Journal of Semiconductors
	2011
卷号	Vol.32 No.2页码:022003
关键词	Absorption spectroscopy Crystal oscillators Optical constants Quartz Refractive index Substrates Ternary alloys Ternary systems X ray diffraction X ray diffraction analysis X ray photoelectron spectroscopy X rays Zinc
ISSN号	1674-4926
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/1993384
专题	四川大学
作者单位	1.College of Materials Science and Engineering, Sichuan University, Chengdu 610064, China 2.waylee2000@sohu.com
推荐引用方式 GB/T 7714	Di Xia,Tian Caijuan,Tang Rongzhe,et al. Structural and optical properties of Cd0.8Zn0.2S thin films[J]. Journal of Semiconductors,2011,Vol.32 No.2:022003.
APA	Di Xia.,Tian Caijuan.,Tang Rongzhe.,Li Wei.,Feng Lianghuan.,...&Lei Zhi.(2011).Structural and optical properties of Cd0.8Zn0.2S thin films.Journal of Semiconductors,Vol.32 No.2,022003.
MLA	Di Xia,et al."Structural and optical properties of Cd0.8Zn0.2S thin films".Journal of Semiconductors Vol.32 No.2(2011):022003.

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