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	Sub-100nm resolution PSIM by utilizing modified optical vortices with fractional topological charges for precise phase shifting
	Shibiao Wei; Ting Lei; Luping Du; Chonglei Zhang; Houkai Chen; Yong Yang; S. W. Zhu; X.-C. Yuan
刊名	Optics Express
	2015
卷号	Vol.23 No.23页码:30143-30148
关键词	Superresolution Imaging systems Surface plasmons
ISSN号	1094-4087
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/1861584
专题	南开大学
作者单位	Nanophotonics Research Centre, Shenzhen University & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, China2Institute of Modern Optics, Nankai University, Tianjin 300071, China3Nankai University Affiliated Hospital, Tianjin 300121, China4contributed equally to this work5lpdu@szu.edu.cn6xcyuan@szu.edu.cn
推荐引用方式 GB/T 7714	Shibiao Wei,Ting Lei,Luping Du,et al. Sub-100nm resolution PSIM by utilizing modified optical vortices with fractional topological charges for precise phase shifting[J]. Optics Express,2015,Vol.23 No.23:30143-30148.
APA	Shibiao Wei.,Ting Lei.,Luping Du.,Chonglei Zhang.,Houkai Chen.,...&X.-C. Yuan.(2015).Sub-100nm resolution PSIM by utilizing modified optical vortices with fractional topological charges for precise phase shifting.Optics Express,Vol.23 No.23,30143-30148.
MLA	Shibiao Wei,et al."Sub-100nm resolution PSIM by utilizing modified optical vortices with fractional topological charges for precise phase shifting".Optics Express Vol.23 No.23(2015):30143-30148.

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