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High stable dielectric permittivity and low dielectric loss in sol–gel derived BiFeO thin films
Ren, YJ; Zhu, XH; Zhang, CY; Zhu, JL; Zhu, JG; Xiao, DQ
刊名Ceramics International
2014
卷号Vol.40 No.1Part B页码:2489-2493
关键词A. Sol–gel C. Dielectric properties BiFeO3 Microstructure Thin films
ISSN号0272-8842;1873-3956
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/1843912
专题四川大学
作者单位Sichuan Univ, Dept Mat Sci, Chengdu 610064, Peoples R China
推荐引用方式
GB/T 7714
Ren, YJ,Zhu, XH,Zhang, CY,et al. High stable dielectric permittivity and low dielectric loss in sol–gel derived BiFeO thin films[J]. Ceramics International,2014,Vol.40 No.1Part B:2489-2493.
APA Ren, YJ,Zhu, XH,Zhang, CY,Zhu, JL,Zhu, JG,&Xiao, DQ.(2014).High stable dielectric permittivity and low dielectric loss in sol–gel derived BiFeO thin films.Ceramics International,Vol.40 No.1Part B,2489-2493.
MLA Ren, YJ,et al."High stable dielectric permittivity and low dielectric loss in sol–gel derived BiFeO thin films".Ceramics International Vol.40 No.1Part B(2014):2489-2493.
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