Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets

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	Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets
	Shen, Yue 1,2; Wang, Ying 2,3; Zhang, Jinjin 2; Hai, Chunxi 1; Zhou, Yuan 1; Hu, Jun 2; Zhang, Yi 2
刊名	JOURNAL OF APPLIED PHYSICS
	2014-06-28
卷号	115 期号:24
文献子类	Article
英文摘要	A unique operation mode of scanning polarization force microscopy (SPFM) was developed for characterizing reduced graphene oxide (rGO) sheets that were individually charged, mainly by monitoring the change of the sample's apparent height along with its surface potential. The principles and features of this sample-charged mode SPFM (SC-SPFM) were introduced. By comparing with other scanning-probe based techniques that characterize the surface electrical properties, including the traditional tip-biased mode SPFM, electrostatic force microscopy, and Kelvin probe force microscopy, it was found that the SC-SPFM has higher sensitivity and lateral resolution. Furthermore, by monitoring charge transfer between two rGO sheets with SC-SPFM, the "good"or "bad"contacts related to junction geometry at the nanometer scale can be visualized clearly. (C) 2014 AIP Publishing LLC.
WOS关键词	WETTING PROPERTIES ; GRAPHITE OXIDE ; WATER ; GLYCEROL ; CONDENSATION ; LIQUIDS ; SINGLE ; MICA
WOS研究方向	Physics
语种	英语
WOS记录号	WOS:000338633600035
内容类型	期刊论文
源URL	[http://ir.isl.ac.cn/handle/363002/5664]
专题	青海盐湖研究所_青海盐湖研究所知识仓储青海盐湖研究所_盐湖资源与化学实验室中国科学院青海盐湖研究所
作者单位	1.Chinese Acad Sci, Qinghai Inst Salt Lakes, Xining 810008, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Shen, Yue,Wang, Ying,Zhang, Jinjin,et al. Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets[J]. JOURNAL OF APPLIED PHYSICS,2014,115(24).
APA	Shen, Yue.,Wang, Ying.,Zhang, Jinjin.,Hai, Chunxi.,Zhou, Yuan.,...&Zhang, Yi.(2014).Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.JOURNAL OF APPLIED PHYSICS,115(24).
MLA	Shen, Yue,et al."Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets".JOURNAL OF APPLIED PHYSICS 115.24(2014).