| Cutoff wavelength of Hg1xCdxTe epilayers by infrared photoreflectance spectroscopy | |
| JunShao; XiangLü; WeiLu; FangyuYue; WeiHuangetal. | |
| 刊名 | Applied Physics Letters
 |
| 2007 | |
| 卷号 | 90 |
| 公开日期 | 2011-10-11 |
| 内容类型 | 期刊论文 |
| 源URL | [http://202.127.1.142/handle/181331/2386]  |
| 专题 | 上海技术物理研究所_上海技物所 |
| 推荐引用方式 GB/T 7714 | JunShao,XiangLü,WeiLu,et al. Cutoff wavelength of Hg1xCdxTe epilayers by infrared photoreflectance spectroscopy[J]. Applied Physics Letters,2007,90. |
| APA | JunShao,XiangLü,WeiLu,FangyuYue,&WeiHuangetal..(2007).Cutoff wavelength of Hg1xCdxTe epilayers by infrared photoreflectance spectroscopy.Applied Physics Letters,90. |
| MLA | JunShao,et al."Cutoff wavelength of Hg1xCdxTe epilayers by infrared photoreflectance spectroscopy".Applied Physics Letters 90(2007). |
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