Identifying Single Event Transients Location based on Compressed Sensing

	Identifying Single Event Transients Location based on Compressed Sensing
	Cuiping Shao; Huiyun Li
刊名	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
	2017
文献子类	期刊论文
英文摘要	Single event transients (SETs) have seriously deteriorated the reliability of integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and design enhancement. Traditional methods of location identification of SETs s usually require special sensors embedded into the circuits, or radiation scanning with fine resolutions over the surface for inspection. In this paper, we propose a method of location identification of SETs without sensors or image processing. We formulate location identification of SETs as a compressed sensing problem due to the sparsity and non-coherence observation. The simulation result on a cryptographic IC is demonstrated. The results illustrate that the proposed method has three advantages, compared to traditional SETs test methods: 1) the SETs sensitive area can be accurately identified. 2) The sampling rate is reduced by 64%, therefore the test efficiency is largely enhanced with negligible hardware overhead. 3) The method of location identification of SETs is robust to noise interference.
URL标识	查看原文
语种	英语
内容类型	期刊论文
源URL	[http://ir.siat.ac.cn:8080/handle/172644/11582]
专题	深圳先进技术研究院_集成所
作者单位	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
推荐引用方式 GB/T 7714	Cuiping Shao,Huiyun Li. Identifying Single Event Transients Location based on Compressed Sensing[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2017.
APA	Cuiping Shao,&Huiyun Li.(2017).Identifying Single Event Transients Location based on Compressed Sensing.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS.
MLA	Cuiping Shao,et al."Identifying Single Event Transients Location based on Compressed Sensing".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (2017).