Development of High Sensitive X-Ray Mapping for SC Cavities

	Development of High Sensitive X-Ray Mapping for SC Cavities
	H.Tongu; H.Hokonohara; Y.Iwashita
	2017
会议日期	2017
会议地点	Denmark
会议录	Proceedings of the 8th International Particle Accelerator Conference
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/261535]
专题	学术会议_国际参会_JaCoW高能所参会会议_IPAC
作者单位	Kyoto ICR, Uji, Kyoto, Japan
推荐引用方式 GB/T 7714	H.Tongu,H.Hokonohara,Y.Iwashita. Development of High Sensitive X-Ray Mapping for SC Cavities[C]. 见:. Denmark. 2017.