Noise Analysis and Optimization of a Unity Gain Sampler

CORC > 沈阳自动化研究所 > 中国科学院沈阳自动化研究所 > 光电信息技术研究室

	Noise Analysis and Optimization of a Unity Gain Sampler
	Wang X(王霄); Zhao YH(赵耀宏); Qiao J(乔俊); Shi ZL(史泽林)
	2017
会议名称	2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)
会议日期	November 8-11, 2017
会议地点	Nanjing, CHINA
关键词	Unity gain sampler noise model thermal noise correlated double sampling time domain noise simulation
页码	78-81
通讯作者	Wang X(王霄)
中文摘要	Noise analysis of a widely used switched capacitor unity gain sampler is presented, which in detail shows that the circuit structure can not only get rid of the offset voltage induced by the OTA involved, but also has the ability of suppressing 1/f noise with operation timing of the sampling capacitor, functioning as correlated double sampling in fact, however paying the price of increasing thermal noise. The noise analysis method starts from establishing noise model for the sampler in each individual clock phase. Then based on the characteristic of charge transferring by capacitors and theory of random process, the output noise power contributed by each noise source is derived, the key point of which is that how to determine whether the process of some noise source in some phase transferring to the output node is effected by filtering. At last optimization design for the capacitor elements, which determine the whole noise power, is conducted.
收录类别	EI ; CPCI（ISTP）
产权排序	1
会议录	2017 2ND IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS AND MICROSYSTEMS (ICICM)
会议录出版者	IEEE
会议录出版地	NEW YORK
语种	英语
ISBN号	978-1-5386-3506-3
WOS记录号	WOS:000425209500017
内容类型	会议论文
源URL	[http://ir.sia.cn/handle/173321/21557]
专题	沈阳自动化研究所_光电信息技术研究室
作者单位	1.Shenyang Institute of Automation, Chinese Academy of Sciences 2.Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110016, China
推荐引用方式 GB/T 7714	Wang X,Zhao YH,Qiao J,et al. Noise Analysis and Optimization of a Unity Gain Sampler[C]. 见:2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM). Nanjing, CHINA. November 8-11, 2017.