The methodology study of trace element in-situ analyses using Laser Ablation Inductively Coupled Plasma Mass Spectrometer.

	The methodology study of trace element in-situ analyses using Laser Ablation Inductively Coupled Plasma Mass Spectrometer.
	Xu, P ; Guan, H ; Sun, M ; John, M
刊名	ACTA PETROLOGICA SINICA
	2000-05-01
卷号	16 期号:2 页码:291-304
关键词	LA-ICP-Mass trace elements accuracy precision
ISSN号	1000-0569
文献子类	Article
英文摘要	National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 610, 612, 614 glasses have been measured by Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). The experiments are designed elaborately to optimal UV laser probe (266 nm) and ICP-MS operating conditions. The measurement results of 78 experiments of 25 groups in 5 days show that 30 trace elements in NIST612 have the statistic precision of about 4% when the (44)Ca was chosen as internal standard, meanwhile those elements of same NIST612 standard glass have the statistic precision of about 6% when the (29)Si was chosen as the internal standard. Good measurement accuracy of less than 10% which compared with certified data can also be acquired routinely when we measure the NIST610, NIST612 and NIST614 glasses using the NIST612 as the calibration reference material. The total relative statistic deviation of measurement can be deduced by two individual test statistic deviations. Choosing NIST612 as calibration reference material, we get total relative statistic deviation value of less than 10% of most trace elements both in NIST610 (450 mu g/g) and in NIST612 (40 mu g/g) when we choose (44)Ca as internal standard. By the contrast, we can get the total relative statistic deviation value of 15% to most of trace elements in NIST612 if we choose 29Si as internal standard. It suggests that (44)Ca is better than (29)Si as the internal standard mass. Except to Ni, Sc, Rb, Zr, Sm, Gd and Pb, that most of trace elements have the total relative statistic deviation value of less than 20% in NIST614(0. 8 mu g/g) which is a little higher than in NIST610 and NIST612 show that the measurement precision will deteriorate with the decreasing of concentration of measured element. High blank accounts for the bad Sc value and the interference of CaO may account for the bad Ni value. The bad precision of Rb, Zr, Sm, Gd and Ph may result from the memory effect of whole system which will be displayed more obviously when we analysis the low concentration elements.
WOS关键词	ICP-MS ; GLASSES
WOS研究方向	Geology
语种	英语
出版者	SCIENCE CHINA PRESS
WOS记录号	WOS:000088761800021
内容类型	期刊论文
源URL	[http://ir.iggcas.ac.cn/handle/132A11/76421]
专题	中国科学院地质与地球物理研究所
通讯作者	Xu, P
作者单位	1.Chinese Acad Sci, Inst Geol & Geophys, Beijing 100029, Peoples R China 2.Univ Hong Kong, Dept Earth Sci, Hong Kong, Hong Kong, Peoples R China
推荐引用方式 GB/T 7714	Xu, P,Guan, H,Sun, M,et al. The methodology study of trace element in-situ analyses using Laser Ablation Inductively Coupled Plasma Mass Spectrometer.[J]. ACTA PETROLOGICA SINICA,2000,16(2):291-304.
APA	Xu, P,Guan, H,Sun, M,&John, M.(2000).The methodology study of trace element in-situ analyses using Laser Ablation Inductively Coupled Plasma Mass Spectrometer..ACTA PETROLOGICA SINICA,16(2),291-304.
MLA	Xu, P,et al."The methodology study of trace element in-situ analyses using Laser Ablation Inductively Coupled Plasma Mass Spectrometer.".ACTA PETROLOGICA SINICA 16.2(2000):291-304.