Thickness and microstructure characterization of TGO in thermal barrier coatings by 3D reconstruction
Song, Xuemei1; Meng, Fangli1; Kong, Mingguang2; Wang, Yongzhe1; Huang, Liping3; Zheng, Xuebin3; Zeng, Yi1,4
刊名MATERIALS CHARACTERIZATION
2016-10-01
卷号120期号:页码:244-248
关键词Tbcs Thermal Service Tgo Thickness Microstructure 3d-sem
DOI10.1016/j.matchar.2016.09.006
文献子类Article
英文摘要Yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs) are prepared by plasma spraying. Thermally grown oxide (TGO) would be formed between YSZ topcoat and bond coat after 50 h thermal service for YSZ TBCs. The electron back scattered diffraction (EBSD) results reveal that the TGO layer is composed of alpha-Al2O3 and cubic Al2NiO4 layers. Measured values of TGO thickness from the 2D-SEM image are greater than or equal to its real thickness due to the fact that the TGO layer is much rolling so that up and down surfaces of the TGO can't be completely perpendicular to the cross-section direction confirmed by 3D-SEM. Furthermore, 3D-SEM results reveal that the real thickness of TGO layer is 3.10 mu m instead of 7.1 mu m. In addition, 3D-EBSD confirmed that alpha-Al2O3 layer in TGO is composed of single layer of grains and Al2NiO4 layer consist of multilayer of grains while alpha-Al2O3 layer is mixed with single layer and multilayer of alpha-Al2O3 grains from observation of the 2D-EBSD image. It provides a new method to characterize real thickness and microstructure of TGO, which is also applied to other film materials. (C) 2016 Elsevier Inc. All rights reserved.
WOS关键词GROWTH-BEHAVIOR ; DURABILITY ; ENGINES ; TBCS
WOS研究方向Materials Science ; Metallurgy & Metallurgical Engineering
语种英语
WOS记录号WOS:000386413900028
资助机构National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; (XDB22010202) ; (XDB22010202) ; (XDB22010202) ; (XDB22010202) ; National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; National Key Technologies R&D Program of China(2016YFA0201103) ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; CAS Key Technology Talent Program ; (XDB22010202) ; (XDB22010202) ; (XDB22010202) ; (XDB22010202)
内容类型期刊论文
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/30146]  
专题合肥物质科学研究院_中科院固体物理研究所
作者单位1.Chinese Acad Sci, State Key Lab High Performance Ceram & Superfine, Shanghai Inst Ceram, Shanghai 200050, Peoples R China
2.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China
3.Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Coating Mat, Shanghai 200050, Peoples R China
4.CAS Ctr Excellence Superconducting Elect CENSE, Shanghai 200050, Peoples R China
推荐引用方式
GB/T 7714
Song, Xuemei,Meng, Fangli,Kong, Mingguang,et al. Thickness and microstructure characterization of TGO in thermal barrier coatings by 3D reconstruction[J]. MATERIALS CHARACTERIZATION,2016,120(无):244-248.
APA Song, Xuemei.,Meng, Fangli.,Kong, Mingguang.,Wang, Yongzhe.,Huang, Liping.,...&Zeng, Yi.(2016).Thickness and microstructure characterization of TGO in thermal barrier coatings by 3D reconstruction.MATERIALS CHARACTERIZATION,120(无),244-248.
MLA Song, Xuemei,et al."Thickness and microstructure characterization of TGO in thermal barrier coatings by 3D reconstruction".MATERIALS CHARACTERIZATION 120.无(2016):244-248.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace