Optical rectification and Pockels effect as a method to detect the properties of Si surfaces

	Optical rectification and Pockels effect as a method to detect the properties of Si surfaces
	Qi Wang; Li Zhang; Xin Wang; Haiyan Quan; Zhanguo Chen; Jihong Zhao; Xiuhuan Liu; Lixin Hou; YanjunGao; Gang Jia
刊名	CHINESE OPTICS LETTERS
	2017
卷号	15 期号:6 页码:062401
学科主题	光电子学
公开日期	2018-07-09
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/28753]
专题	半导体研究所_光电子研究发展中心
推荐引用方式 GB/T 7714	Qi Wang,Li Zhang,Xin Wang,et al. Optical rectification and Pockels effect as a method to detect the properties of Si surfaces[J]. CHINESE OPTICS LETTERS,2017,15(6):062401.
APA	Qi Wang.,Li Zhang.,Xin Wang.,Haiyan Quan.,Zhanguo Chen.,...&Shaowu Chen.(2017).Optical rectification and Pockels effect as a method to detect the properties of Si surfaces.CHINESE OPTICS LETTERS,15(6),062401.
MLA	Qi Wang,et al."Optical rectification and Pockels effect as a method to detect the properties of Si surfaces".CHINESE OPTICS LETTERS 15.6(2017):062401.