Nonsubsampled contourlet transform method for optical fringe pattern analysis in profilometry and interferometry

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 信息光学与光电技术实验室

	Nonsubsampled contourlet transform method for optical fringe pattern analysis in profilometry and interferometry
	Li, Sikun; Wang, Xiangzhao; Tang, Feng; Bu, Yang; Sasaki, Osami
刊名	Appl. Optics
	2016
卷号	55 期号:27 页码:7718
通讯作者	wxz26267@siom.ac.cn
英文摘要	A method based on a nonsubsampled contourlet transform, which is an overcomplete transform with multiresolution, directionality, and shift-invariance properties, is proposed to extract the fundamental frequency component of an optical fringe pattern in profilometry and interferometry. The nonsubsampled contourlet transform method overcomes the disadvantages of the original contourlet transform method, which lacks the shift-invariance property. Besides, it improves the frequency selectivity. A strategy is developed to automatically determine the optimal decomposition scale for removing the background intensity and suppressing the noise of the fringe pattern. The proposed method is precise, effective, and possesses a strong noise immune ability. Simulations and experiments verify the validity, and show the superiorities of the proposed method. (C) 2016 Optical Society of America
收录类别	SCI
资助信息	National Natural Science Foundation of China (NSFC) [61205102, 61275207, 61474129, 61405210]
WOS记录号	WOS:000383996900036
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/28511]
专题	上海光学精密机械研究所_信息光学与光电技术实验室
作者单位	中国科学院上海光学精密机械研究所
推荐引用方式 GB/T 7714	Li, Sikun,Wang, Xiangzhao,Tang, Feng,et al. Nonsubsampled contourlet transform method for optical fringe pattern analysis in profilometry and interferometry[J]. Appl. Optics,2016,55(27):7718.
APA	Li, Sikun,Wang, Xiangzhao,Tang, Feng,Bu, Yang,&Sasaki, Osami.(2016).Nonsubsampled contourlet transform method for optical fringe pattern analysis in profilometry and interferometry.Appl. Optics,55(27),7718.
MLA	Li, Sikun,et al."Nonsubsampled contourlet transform method for optical fringe pattern analysis in profilometry and interferometry".Appl. Optics 55.27(2016):7718.