Polarization effects in femtosecond laser induced amorphization of monocrystalline silicon
Fan, Wen-Zhong; Huang, Yuan-Yuan; Pan, Huai-Hai; Wang, Zhuo; Wang, Cheng-Wei; Qian, Jing; Li, Yang-Bo; Zhao, Quan-Zhong; Bai, Feng; Li, Hong-Jin
刊名Chem. Phys. Lett.
2016
卷号662页码:102
通讯作者zqz@siom.ac.cn
英文摘要We have used femtosecond laser pulses to ablate monocrystalline silicon wafer. Raman spectroscopy and X-ray diffraction analysis of ablation surface indicates horizontally polarized laser beam shows an enhancement in amorphization efficiency by a factor of 1.6-1.7 over the circularly polarized laser ablation. This demonstrates that one can tune the amorphization efficiency through the polarization of irradiation laser. (C) 2016 Elsevier B.V. All rights reserved.
收录类别SCI
资助信息National Natural Science Foundation of China [61178024, 11374316]
WOS记录号WOS:000386860900018
内容类型期刊论文
源URL[http://ir.siom.ac.cn/handle/181231/28691]  
专题上海光学精密机械研究所_强场激光物理国家重点实验室
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Fan, Wen-Zhong,Huang, Yuan-Yuan,Pan, Huai-Hai,et al. Polarization effects in femtosecond laser induced amorphization of monocrystalline silicon[J]. Chem. Phys. Lett.,2016,662:102.
APA Fan, Wen-Zhong.,Huang, Yuan-Yuan.,Pan, Huai-Hai.,Wang, Zhuo.,Wang, Cheng-Wei.,...&Li, Hong-Jin.(2016).Polarization effects in femtosecond laser induced amorphization of monocrystalline silicon.Chem. Phys. Lett.,662,102.
MLA Fan, Wen-Zhong,et al."Polarization effects in femtosecond laser induced amorphization of monocrystalline silicon".Chem. Phys. Lett. 662(2016):102.
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