SIMULATION OF RECOIL PROTON SPECTRA AND HYDROGEN DEPTH PROFILES IN AMORPHOUS-SILICON FILMS

	SIMULATION OF RECOIL PROTON SPECTRA AND HYDROGEN DEPTH PROFILES IN AMORPHOUS-SILICON FILMS
	LIAO, CG; WANG, YQ; YANG, SS; JIANG, H; ZHENG, ZH
	1993-06
会议名称	12TH INTERNATIONAL CONF ON THE APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY
会议日期	NOV 02-05, 1992
会议地点	DENTON, TX
卷号	79
期号	1-4
页码	478-482
通讯作者	LIAO, CG (reprint author), LANZHOU UNIV,DEPT MODERN PHYS,LANZHOU 730001,PEOPLES R CHINA.
会议主办者	UNIV N TEXAS
会议录	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版地	AMSTERDAM
学科主题	Instruments & Instrumentation; Nuclear Science & Technology; Physics
语种	英语
ISSN号	0168-583X
WOS记录号	WOS:A1993LH98400127
内容类型	会议论文
源URL	[http://ir.lzu.edu.cn/handle/262010/184953]
专题	核科学与技术学院_会议论文
推荐引用方式 GB/T 7714	LIAO, CG,WANG, YQ,YANG, SS,et al. SIMULATION OF RECOIL PROTON SPECTRA AND HYDROGEN DEPTH PROFILES IN AMORPHOUS-SILICON FILMS[C]. 见:12TH INTERNATIONAL CONF ON THE APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY. DENTON, TX. NOV 02-05, 1992.