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Scaling of the thickness dependent anomalous Hall effect in amorphous ferromagnetic thin films
Fan, XL; Chen, H; Rao, JW; Zhou, HA; Zhang, YC; Zhao, XB; Xue, DS
刊名JOURNAL OF APPLIED PHYSICS
2014-05-07
卷号115期号:17页码:-
ISSN号0021-8979
通讯作者Fan, XL (reprint author), Lanzhou Univ, Minist Educ, Key Lab Magnetism & Magnet Mat, Lanzhou 730000, Peoples R China.
学科主题Physics
语种英语
WOS记录号WOS:000335643700372
内容类型期刊论文
源URL[http://202.201.7.4/handle/262010/106585]  
专题物理科学与技术学院_期刊论文
推荐引用方式
GB/T 7714
Fan, XL,Chen, H,Rao, JW,et al. Scaling of the thickness dependent anomalous Hall effect in amorphous ferromagnetic thin films[J]. JOURNAL OF APPLIED PHYSICS,2014,115(17):-.
APA Fan, XL.,Chen, H.,Rao, JW.,Zhou, HA.,Zhang, YC.,...&Xue, DS.(2014).Scaling of the thickness dependent anomalous Hall effect in amorphous ferromagnetic thin films.JOURNAL OF APPLIED PHYSICS,115(17),-.
MLA Fan, XL,et al."Scaling of the thickness dependent anomalous Hall effect in amorphous ferromagnetic thin films".JOURNAL OF APPLIED PHYSICS 115.17(2014):-.
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