Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110

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	Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110
	Ren Qiang 1; Liu Huijuan 1; Zhang Zengyan 1; Feng Jing 2; Xu Shichang 2; Pu Zongjun 3; Xin Zhiyong 1
刊名	Journal of Integrative Agriculture
	2012
卷号	11 期号:4 页码:521-527
关键词	synthetic wheat Puccinia striiformis f.sp.tritici resistance gene simple sequence repeat(SSR) marker gene postulation
ISSN号	2095-3119
英文摘要	Stripe rust,caused by Puccinia striiformis f.sp.tritici(Pst),is one of the most destructive diseases of wheat(Triticum aestivum L.).To diversify stripe rust-resistant resources for wheat breeding programs,a CIMMYT synthetic wheat line CI110 was identified to be resistant to 28 isolates of Pst,including 6 Chinese prevalent races CYR28-CYR33.Genetic analysis indicated that a single dominant gene was responsible for the stripe rust resistance in CI110,temporarily designated YrC110.A molecular map,harboring YrC110 and 9 linked SSR markers,was constructed through simple sequence repeat(SSR),and bulked segregant analysis.These linked markers and YrC110 were assigned on the short arm of chromosome 1B using the Chinese Spring nullisomic-tetrasomic and ditelosomic stocks.Gene postulation based on seedling reaction patterns to 30 Pst isolates suggested that the resistance gene YrC110 seemed different from the other known resistance genes tested,such as Yr9,Yr10,Yr15,Yr24,and Yr26/YrCH42.Four SSR markers Xbarc187150,Xgwm18227,Xgwm11223,and Xbarc240292 distinguished YrC110 from Yr10,Yr15,Yr24,and Yr26/YrCH42,and could be used as diagnostic ones for YrC110 in wheat resistant breeding programs against stripe rust.
学科主题	农作物
语种	英语
内容类型	期刊论文
源URL	[http://ir.nais.net.cn/handle/2HMLN22E/131127]
专题	作物科学研究所
作者单位	1.Institute of Crop Sciences,Chinese Academy of Agricultural Sciences, The National Key Facility for Crop Gene Resources and Genetic Improvement;;Key Laboratory of Biology and Genetic Improvement of Triticeae Crops,Ministry of Agriculture, Beijing, 100081; 2.Institute of Plant Protection,Chinese Academy of Agricultural Sciences, Beijing, 100193; 3.Crop Research Institute,Sichun Academy of Agricultural Sciences, Chengdu, 610066
推荐引用方式 GB/T 7714	Ren Qiang,Liu Huijuan,Zhang Zengyan,et al. Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110[J]. Journal of Integrative Agriculture,2012,11(4):521-527.
APA	Ren Qiang.,Liu Huijuan.,Zhang Zengyan.,Feng Jing.,Xu Shichang.,...&Xin Zhiyong.(2012).Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110.Journal of Integrative Agriculture,11(4),521-527.
MLA	Ren Qiang,et al."Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110".Journal of Integrative Agriculture 11.4(2012):521-527.