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Mapping of Quantitative Trait Loci for Adult Plant Resistance to Stripe Rust in German Wheat Cultivar Ibis
Bai Bin1,2,3; Ren Yan1; Xia Xian-chun1; Du Jiu-yuan3; Zhou Gang3; Wu Ling4; Zhu Hua-zhong4; He Zhong-hu1,5; Wang Cheng-she2
刊名JOURNAL OF INTEGRATIVE AGRICULTURE
2012
卷号11期号:4页码:528-536
关键词Triticum aestivum Puccinia striiformis APR simple sequence repeat
ISSN号2095-3119
通讯作者Bai Bin
英文摘要The German wheat cultivar Ibis has excellent adult plant resistance (APR) to stripe rust in Gansu, a hotspot for stripe rust in China. To elucidate the genetic basis of APR to stripe rust in Ibis, 237 F-3 lines derived from the cross Ibis/Huixianhong were evaluated at Tianshui, Gansu, in the 2008-2009 and 2009-2010 cropping seasons, and at Chengdu, Sichuan Province, China, in the 2009-2010 cropping season. Inoculations were conducted with a mixture of several prevalent Pst races in both locations. Maximum disease severity (MDS) data showed a continuous distribution of response, indicating quantitative nature of resistance to stripe rust in Ibis. The broad-sense heritability of MDS was 0.75 based on the mean values averaged across three environments. A total of 723 simple sequence repeat (SSR) markers were used to map the QTL for APR by inclusive composite interval mapping (ICIM). QTLs mapping to chromosomes 2BS and 6BS, designated as QYr.caas-2BS.1 and QYr.caas-6BS.1, respectively, explained 4.1-40.7% of the phenotypic variance in MDS across environments. The major effect QTL QYr.caas-2BS.1, flanked by Xgwm148 and Xwmc360, was consistently detected at all three sites as well as the averaged data over three environments, accounting for 40.7, 24.2, 5.2 and 29.9% of phenotypic variance, respectively. The molecular markers closely linked to this QTL have potential for use in marker-assisted selection and gene pyramiding to improve the durability of stripe rust resistance in wheat breeding.
学科主题Agriculture, Multidisciplinary ; AGRICULTURE, MULTIDISCIPLINARY
语种英语
出版者ELSEVIER SCI LTD
WOS记录号WOS:000302837600002
内容类型期刊论文
源URL[http://111.203.20.206/handle/2HMLN22E/5216]  
专题作物科学研究所
作者单位1.Chinese Acad Agr Sci, Inst Crop Sci, Natl Wheat Improvement Ctr, Natl Key Facil Crop Gene Resources & Genet Improv, Beijing 100081, Peoples R China
2.NW A&F Univ, State Key Lab Crop Stress Biol Arid Areas, Coll Agron, Yangling 712100, Peoples R China
3.Gansu Acad Agr Sci, Wheat Res Inst, Lanzhou 730070, Peoples R China
4.Sichuan Acad Agr Sci, Crop Res Inst, Chengdu 610066, Peoples R China
5.Chinese Acad Agr Sci, CIMMYT China Off, Beijing 100081, Peoples R China
推荐引用方式
GB/T 7714
Bai Bin,Ren Yan,Xia Xian-chun,et al. Mapping of Quantitative Trait Loci for Adult Plant Resistance to Stripe Rust in German Wheat Cultivar Ibis[J]. JOURNAL OF INTEGRATIVE AGRICULTURE,2012,11(4):528-536.
APA Bai Bin.,Ren Yan.,Xia Xian-chun.,Du Jiu-yuan.,Zhou Gang.,...&Wang Cheng-she.(2012).Mapping of Quantitative Trait Loci for Adult Plant Resistance to Stripe Rust in German Wheat Cultivar Ibis.JOURNAL OF INTEGRATIVE AGRICULTURE,11(4),528-536.
MLA Bai Bin,et al."Mapping of Quantitative Trait Loci for Adult Plant Resistance to Stripe Rust in German Wheat Cultivar Ibis".JOURNAL OF INTEGRATIVE AGRICULTURE 11.4(2012):528-536.
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