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	Preparation and properties of CCTO-BCTO ceramics with ultrahigh dielectric constant
	Chen, La ; Li, Wei ; Xiong, Zhao Xian ; Song, Chun Xiao ; Qiu, Hong ; Xiong ZX(熊兆贤)
	2013
关键词	Dielectric losses Dielectric properties Electronics engineering Grain boundaries Information technology Scanning electron microscopy Solid state reactions Spectroscopy X ray diffraction
英文摘要	Conference Name:2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013. Conference Address: Zhengzhou, Henan, China. Time:October 19, 2013 - October 20, 2013.; Computer Science and Electronic Technology; Trans tech publications inc.; National Cheng Kung University; Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary. ? (2013) Trans Tech Publications, Switzerland.
语种	英语
出处	http://dx.doi.org/10.4028/www.scientific.net/AMR.760-762.705
出版者	Trans Tech Publications Ltd
内容类型	其他
源URL	[http://dspace.xmu.edu.cn/handle/2288/85125]
专题	材料学院－会议论文
推荐引用方式 GB/T 7714	Chen, La,Li, Wei,Xiong, Zhao Xian,et al. Preparation and properties of CCTO-BCTO ceramics with ultrahigh dielectric constant. 2013-01-01.

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