Photoreflectance Spectroscopy Characterization of Ge/Si016Ge084 Multiple Quantum Wells on Ge Virtual Substrate

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	Photoreflectance Spectroscopy Characterization of Ge/Si016Ge084 Multiple Quantum Wells on Ge Virtual Substrate
	Hsu, Hung-Pin ; Yang, Pong-Hong ; Huang, Jeng-Kuang ; Wu, Po-Hung ; Huang, Ying-Sheng ; Li, Cheng ; Huang, Shi-Hao ; Tiong, Kwong-Kau ; Li C(李成)
刊名	http://dx.doi.org/10.1155/2013/298190
	2013
关键词	TEMPERATURE-DEPENDENCE SILICON GERMANIUM SEMICONDUCTORS SI
英文摘要	National Science Council of Taiwan [NSC100-2221-E-131-005-MY2, NSC102-2221-E-131-017, NSC 100-2112-M-011-001-MY3]; National Basic Research Program of China [2012CB933503]; National Natural Science Foundation of China [61036003, 61176092]; We report a detailed characterization of a Ge/Si0.16Ge0.84 multiple quantum well (MQW) structure on Ge-on-Si virtual substrate (VS) grown by ultrahigh vacuum chemical vapor deposition by using temperature-dependent photoreflectance (PR) in the temperature range from 10 to 300 K. The PR spectra revealed a wide range of optical transitions from the MQW region as well as transitions corresponding to the light-hole and heavy-hole splitting energies of Ge-on-Si VS. A detailed comparison of PR spectral line shape fits and theoretical calculation led to the identification of various quantum-confined interband transitions. The temperature-dependent PR spectra of Ge/Si0.16Ge0.84 MQW were analyzed using Varshni and Bose-Einstein expressions. The parameters that describe the temperature variations of various quantum-confined interband transition energies were evaluated and discussed.
语种	英语
出版者	HINDAWI PUBLISHING CORPORATION
内容类型	期刊论文
源URL	[http://dspace.xmu.edu.cn/handle/2288/91986]
专题	物理技术－已发表论文
推荐引用方式 GB/T 7714	Hsu, Hung-Pin,Yang, Pong-Hong,Huang, Jeng-Kuang,et al. Photoreflectance Spectroscopy Characterization of Ge/Si016Ge084 Multiple Quantum Wells on Ge Virtual Substrate[J]. http://dx.doi.org/10.1155/2013/298190,2013.
APA	Hsu, Hung-Pin.,Yang, Pong-Hong.,Huang, Jeng-Kuang.,Wu, Po-Hung.,Huang, Ying-Sheng.,...&李成.(2013).Photoreflectance Spectroscopy Characterization of Ge/Si016Ge084 Multiple Quantum Wells on Ge Virtual Substrate.http://dx.doi.org/10.1155/2013/298190.
MLA	Hsu, Hung-Pin,et al."Photoreflectance Spectroscopy Characterization of Ge/Si016Ge084 Multiple Quantum Wells on Ge Virtual Substrate".http://dx.doi.org/10.1155/2013/298190 (2013).