CORC  > 厦门大学  > 材料学院-已发表论文
Influence of magnetic layer thickness on [Fe80Ni20 - O/SiO2]n multilayer thin films
Wei, Jian-Qing ; Geng, Hao ; Xu, Lei ; Wang, Lai-Sen ; Chen, Yuan-Zhi ; Yue, Guang-Hui ; Peng, Dong-Liang ; Wang LS(王来森) ; Chen YZ(陈远志) ; Yue GH(岳光辉) ; Peng DL(彭栋梁)
刊名http://dx.doi.org/10.1088/1674-1056/23/8/087504
2014
关键词Magnetic films Magnetic materials Magnetic permeability Magnetron sputtering Multilayer films
英文摘要In the present work, a series of [Fe80Ni20 - O/SiO2]n multilayer thin films is fabricated using a reactive magnetron sputtering equipment. The thickness of SiO2 interlayer is fixed at 3 nm, while the thickness values of Fe 80Ni20 - O magnetic films range from 10 nm to 30 nm. All films present obvious in-plane uniaxial magnetic anisotropy. With increasing the Fe80Ni20 - O layer thickness, the saturation magnetization increases slightly and the coercivity becomes larger due to the enlarged grain size, which could weaken the soft magnetic property. The results of high frequency magnetic permeability characterization show that films with thin magnetic layer are more suitable for practical applications. When the thickness of Fe80Ni20 - O layer is 10 nm, the multilayer film exhibits the most comprehensive high-frequency magnetic property with a real permeability of 300 in gigahertz range. ? 2014 Chinese Physical Society and IOP Publishing Ltd.
语种英语
出版者Chinese Physical Society and IOP Publishing Ltd.
内容类型期刊论文
源URL[http://dspace.xmu.edu.cn/handle/2288/87501]  
专题材料学院-已发表论文
推荐引用方式
GB/T 7714
Wei, Jian-Qing,Geng, Hao,Xu, Lei,et al. Influence of magnetic layer thickness on [Fe80Ni20 - O/SiO2]n multilayer thin films[J]. http://dx.doi.org/10.1088/1674-1056/23/8/087504,2014.
APA Wei, Jian-Qing.,Geng, Hao.,Xu, Lei.,Wang, Lai-Sen.,Chen, Yuan-Zhi.,...&彭栋梁.(2014).Influence of magnetic layer thickness on [Fe80Ni20 - O/SiO2]n multilayer thin films.http://dx.doi.org/10.1088/1674-1056/23/8/087504.
MLA Wei, Jian-Qing,et al."Influence of magnetic layer thickness on [Fe80Ni20 - O/SiO2]n multilayer thin films".http://dx.doi.org/10.1088/1674-1056/23/8/087504 (2014).
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