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	Indentation size effect in microhardness measurements of Hg1-xMnxTe
	Wang Ze-wen ; Jie Wan-qi ; Wang Xiao-qin
	2010-10-12 ; 2010-10-12
关键词	Hg1-xMnxTe indentation size effect microhardness HARDNESS Metallurgy & Metallurgical Engineering
中文摘要	The effect of surface damaged layer and Te enrichment layer of Hg1-xMnxTe on the indentation size were studied experimentally. Based on the results, the indentation size effect (ISE) of Hg1-xMnxTe were discussed using different models, including Meyer's law, the power-law, Hays-Kendall approach and the theory of strain gradient plasticity. The results show that surface damaged layer weakens ISE of the wafers, but the Te enrichment layer reinforces it. The minimum test load necessary to initiate plastic deformation for different Hg1-xMnxTe wafers increases from 3.11 to 4.41 g with the increase of x from 0.05 to 0.11. The extrapolated surface hardness values of Hg1-xMnxTe are 347.21, 374.75, 378.28 and 391.51 MPa and the corresponding shear strength values are 694.53, 749.50, 756.56 and 783.12 MPa for Hg1-xMnxTe with the x values of 0.05, 0.07, 0.09 and 0.11, respectively.
语种	英语 ; 英语
出版者	ELSEVIER SCIENCE BV ; AMSTERDAM ; PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/82692]
专题	清华大学
推荐引用方式 GB/T 7714	Wang Ze-wen,Jie Wan-qi,Wang Xiao-qin. Indentation size effect in microhardness measurements of Hg1-xMnxTe[J],2010, 2010.
APA	Wang Ze-wen,Jie Wan-qi,&Wang Xiao-qin.(2010).Indentation size effect in microhardness measurements of Hg1-xMnxTe..
MLA	Wang Ze-wen,et al."Indentation size effect in microhardness measurements of Hg1-xMnxTe".(2010).

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