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Overlapped objects discrimination using dual-energy, high energy X-ray imaging
Li Qinghua ; Li Jianmin ; Wang Xuewu ; Zhang Li ; Kang Kejun ; Zhong Huaqiang
2010-10-12 ; 2010-10-12
关键词Practical Theoretical or Mathematical/ X-ray imaging/ overlapped objects discrimination dual-energy high energy X-ray imaging alpha -curve model X-ray boundary energies peeling off method electron volt energy 1 MeV to 100 MeV/ A0785 X-ray, gamma-ray instruments and techniques B7230G Image sensors B7450 X-ray and gamma-ray equipment/ electron volt energy 1.0E+06 to 1.0E+08 eV
中文摘要A peeling off method was developed for the material discrimination technique with dual-energy, high energy X-rays (1 ~ 10 MeV) to improve the accuracy when inspected objects overlap. An alpha -curve model for material discrimination using X-rays with dual energies of 1 ~ 10 MeV was used to compare the alpha -curves before and after the overlap to reconstruct the alpha -curves of the overlapped objects. Tests were made on a full-scale prototype with X-ray boundary energies of 9 MeV and 6 MeV to discriminate overlapped objects and to calculate the discrimination accuracy. The results show that the method can be used to accurately identify the overlapped objects.
语种中文
出版者Tsinghua University Press ; China
内容类型期刊论文
源URL[http://hdl.handle.net/123456789/82506]  
专题清华大学
推荐引用方式
GB/T 7714
Li Qinghua,Li Jianmin,Wang Xuewu,et al. Overlapped objects discrimination using dual-energy, high energy X-ray imaging[J],2010, 2010.
APA Li Qinghua,Li Jianmin,Wang Xuewu,Zhang Li,Kang Kejun,&Zhong Huaqiang.(2010).Overlapped objects discrimination using dual-energy, high energy X-ray imaging..
MLA Li Qinghua,et al."Overlapped objects discrimination using dual-energy, high energy X-ray imaging".(2010).
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