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	A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole
	Zhang, Chen ; Zhang, Shuang-Nan
	2010-10-12 ; 2010-10-12
关键词	instrumentation: high angular resolution techniques: image processing telescopes TELESCOPES ASTRONOMY MISSION Astronomy & Astrophysics
中文摘要	High angular resolution X-ray imaging is always useful in astrophysics and solar physics. In principle, it can be performed by using coded-mask imaging with a very long mask-detector distance. Previously, the diffraction-interference effect was thought to degrade coded-mask imaging performance dramatically at the low energy end with its very long mask-detector distance. The diffraction-interference effect is described with numerical calculations, and the diffraction-interference cross correlation reconstruction method (DICC) is developed in order to overcome the imaging performance degradation. Based on the DICC, a super-high angular resolution principle (SHARP) for coded-mask X-ray imaging is proposed. The feasibility of coded mask imaging beyond the diffraction limit of a single pinhole is demonstrated with simulations. With the specification that the mask element size is 50 x 50 mu m(2) and the mask-detector distance is 50 m, the achieved angular resolution is 0.32 arcsec above about 10 keV and 0.36 arcsec at 1.24 keV (lambda = 1 nm), where diffraction cannot be neglected. The on-axis source location accuracy is better than 0.02 arcsec. Potential applications for solar observations and wide-field X-ray monitors are also briefly discussed.
语种	英语 ; 英语
出版者	SCIENCE PRESS ; BEIJING ; 16 DONGHUANGCHENGGEN NORTH ST, BEIJING 100717, PEOPLES R CHINA
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/78843]
专题	清华大学
推荐引用方式 GB/T 7714	Zhang, Chen,Zhang, Shuang-Nan. A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole[J],2010, 2010.
APA	Zhang, Chen,&Zhang, Shuang-Nan.(2010).A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole..
MLA	Zhang, Chen,et al."A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole".(2010).

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