Influence of buffer layer thickness on the structure and optical properties of ZnO thin films

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 光学薄膜技术研究与发展中心

	Influence of buffer layer thickness on the structure and optical properties of ZnO thin films
	Hong RJ(洪瑞金) ; Shao JD(邵建达) ; He HB(贺洪波) ; Fan ZX(范正修)
刊名	appl. surf. sci.
	2006
卷号	252 期号:8 页码:2888
关键词	zinc oxide sputtering structure photoluminescence
ISSN号	0169-4332
中文摘要	a series of zno thin films were deposited on zno buffer layers by dc reactive magnetron sputtering. the buffer layer thickness determination of microstructure and optical properties of zno films was investigated by x-ray diffraction (xrd), photoluminescence (pl), optical transmittance and absorption measurements. xrd results revealed that the stress of zno thin films varied with the buffer layer thickness. with the increase of buffer layer thickness, the band gap edge shifted toward longer wavelength. the near-band-edge (nbe) emission intensity of zno films deposited on zno buffer layer also varied with the increase of thickness due to the spatial confinement increasing the coulomb interaction between electrons and holes. the pl measurement showed that the optimum thickness of the zno buffer layer was around 12 nm. (c) 2005 elsevier b.v. all rights reserved.
学科主题	光学薄膜
收录类别	EI
语种	英语
WOS记录号	WOS:000235721800029
公开日期	2009-09-22
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/4186]
专题	上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式 GB/T 7714	Hong RJ,Shao JD,He HB,et al. Influence of buffer layer thickness on the structure and optical properties of ZnO thin films[J]. appl. surf. sci.,2006,252(8):2888, 2893.
APA	洪瑞金,邵建达,贺洪波,&范正修.(2006).Influence of buffer layer thickness on the structure and optical properties of ZnO thin films.appl. surf. sci.,252(8),2888.
MLA	洪瑞金,et al."Influence of buffer layer thickness on the structure and optical properties of ZnO thin films".appl. surf. sci. 252.8(2006):2888.