Analysis of electromagnetic propagation in birefringent thin film

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 光学薄膜技术研究与发展中心

	Analysis of electromagnetic propagation in birefringent thin film
	Qi HJ(齐红基) ; Wang JG ; Shao JD(邵建达) ; Fan ZX(范正修)
刊名	sci. china ser. g-phys. mech. astron.
	2005
卷号	48 期号:5 页码:513
关键词	birefringent thin film interface homolateral refraction behavior wide-angle Brewster's phenomenon
ISSN号	1672-1799
中文摘要	in general, the propagating behavior of extraordinary wave in anisotropic materials is different from that in isotropic materials. with the tangential continuity of maxwell's equations, the electromagnetic propagating behaviors have been investigated at the incident and exit interfaces of the uniaxial anisotropic thin film. the emphasis was placed on two interesting optical phenomena such as homolateral refraction behavior and wide-angle brewster's phenomenon, which occurred at the interfaces of uniaxial anisotropic thin film.
学科主题	光学薄膜
收录类别	EI
语种	英语
WOS记录号	WOS:000233704800001
公开日期	2009-09-22
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/4118]
专题	上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式 GB/T 7714	Qi HJ,Wang JG,Shao JD,et al. Analysis of electromagnetic propagation in birefringent thin film[J]. sci. china ser. g-phys. mech. astron.,2005,48(5):513, 520.
APA	齐红基,Wang JG,邵建达,&范正修.(2005).Analysis of electromagnetic propagation in birefringent thin film.sci. china ser. g-phys. mech. astron.,48(5),513.
MLA	齐红基,et al."Analysis of electromagnetic propagation in birefringent thin film".sci. china ser. g-phys. mech. astron. 48.5(2005):513.