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Optical field measurement of nano-apertures with a scanning near-field optical microscope
Xu Tie-Jun ; Xu Ji-Ying ; Wang Jia ; Tian Qian
2010-05-10 ; 2010-05-10
关键词Experimental/ focused ion beam technology gold metallic thin films nanostructured materials nanotechnology near-field scanning optical microscopy/ optical field measurement nano-apertures scanning near-field optical microscope optical near-field distributions unconventional C-apertures square apertures aperture scanning near-field optical microscope Au film glass substrate focused ion beam technology output light intensity intensity maximum square aperture 200 nm 439 nm 500 nm Au/ A0779 Scanning probe microscopy and related techniques A0760P Optical microscopy A6116P Scanning probe microscopy determinations of structures A6855 Thin film growth, structure, and epitaxy A6146 Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials/ size 2.0E-07 m size 4.39E-07 m size 5.0E-07 m/ Au/el
中文摘要We investigate optical near-field distributions of the unconventional C-apertures and the conventional square apertures in preliminary experiment with an aperture scanning near-field optical microscope. These nano-apertures are fabricated in Au film on a glass substrate with focused ion beam technology. The experimental results indicate the uptrend of output light intensity that a C-aperture enables the intensity maximum to increase at least 10 times more than a square aperture with same unit length. The measured near-field light spot sizes of C-aperture and square aperture with 200-nm unit length are 439 nm * 500 nm and 245 nm * 216 nm, respectively.
语种英语 ; 英语
出版者Chinese Phys. Soc ; China
内容类型期刊论文
源URL[http://hdl.handle.net/123456789/24392]  
专题清华大学
推荐引用方式
GB/T 7714
Xu Tie-Jun,Xu Ji-Ying,Wang Jia,et al. Optical field measurement of nano-apertures with a scanning near-field optical microscope[J],2010, 2010.
APA Xu Tie-Jun,Xu Ji-Ying,Wang Jia,&Tian Qian.(2010).Optical field measurement of nano-apertures with a scanning near-field optical microscope..
MLA Xu Tie-Jun,et al."Optical field measurement of nano-apertures with a scanning near-field optical microscope".(2010).
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